Volta Probe Head

• Minimal compression force
• Exceptional mating cycles
• Unrivaled signal reliability
• Optimized travel at 500, 400, 350, 300, 250, 200, 180 µm pitch
• Exceptional DC and RF performance
• Floating spring probe designs allow for seamless deployment in test WLCSP
• Replacement for cantilever and traditional vertical probe card technologies
• Easy maintenance
• High performance engineered plastic and ceramic material
• Consistent tip co-planarity